Design Debug
Spirox Electrical Lab uses Emiscope/E-Beam for IC internal circuit probing and dynamic timing analysis.

Features:

  • Non-invasive signal probing
  • 10 picoseconds accuracy
  • High resolution Solid Immersion Lens
  • NEXS CAD navigation

Failure Analysis
Spirox Electrical Lab, with ISO 9001:2000 and IECQ certification, uses IREM (Infra-Red Emission Microscopy) to provide consulting, project-based or total solution Failure Analysis for our customers.

These include:

  • ‘Hot Carrier’ Photo-Emission, Back and Front
  • ‘Hot-Spot’ Thermal Emission (Ohmic shorts), Back and Front
  • Dynamic IREM for functional FA


  

Physical Lab
Electrical Lab
Chemical Lab
Reliability Lab

IC Verification Center:
Geoffrey_Lin@spirox.com.tw
Tel. +886-3-6669700
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