NVM Test
Credence Kalos 2

Credence Kalos 2 (K2) provides the speed for next generation devices, parallelism for reducing cost of test as well as lowering cost of ownership. With the flexibility for testing a wide array of devices, K2 offers a complete solution including engineering characterization, wafer and final test on a single system. K2 also provides full software package for device characterization and production.


  • Tester-on-a-Chip architecture 
  • Up to 36 96-pin site or 72 48-pin sites  
  • Up to 36 cards in a system 
  • 100/200/400 MHz test rate 
  • Up to 3456 48 I/O pins

Available: Taiwan, China






Credence Personal Kalos 2
Credence Personal Kalos 2™ (PK2) is a next-generation desktop test system for non-volatile memory (NVM) devices. Based on Credence’s innovative Tester-on-a-Chip™ (ToC) architecture, the PK2 provides industry-leading 200 MHz performance with at-speed error capture RAM (ECR) and hardware-enhanced redundancy analysis. It is the only desktop engineering test system in the industry today able to address a broad range of non-volatile memories (NVM), including NOR and NAND flash, serial flash and embedded flash, as well as associated digital logic devices and other mainstream memory devices.


  • Tester-on-a-Chip architecture 
  • One 96-pin site or two 48-pin sites on a single card 
  • One or 2 cards in a system 
  • 100/200/400 MHz test rate 
  • 48 I/O pins per site 

Available: Taiwan, China



   



Credence Kalos Hex
Credence Kalos is the first flash memory test system designed specifically for the needs of volume manufacturing. Kalos combines 50 MHz performance and 16-site parallel test capability into a single package. The Kalos tester achieves unrivaled non-volatile memory (NVM) test throughput by literally placing a tester behind each device. By aggressively utilizing its deep submicron CMOS ASIC expertise, Credence has engineered a 48 pin, 50 MHz test system onto a single card. Kalos contains up to 16 such "cards", providing each DUT with total site independence. This innovative Tester-on-a-Card architecture enables Kalos to realize the highest level of performance and the smallest footprint of any non-volatile memory ATE system available today.


  • Tester-on-a-Card architecture (Total Site Independence) 
  • 16 sites in parallel 
  • 50 MHz test rate 
  • 48 I/O pins per site 
  • Hardware accelerated redundancy analysis 

Available: Taiwan, China






Credence Personal Kalos 1 Series
Credence Personal Kalos is the first flash memory and flash core microcontroller test system designed specifically for the needs of test engineering. Personal Kalos provides the same 48 all-I/O pins, 50 MHz test site and software used in Kalos family production configurations in a desktop configuration. The innovative Tester-on-a-Card architecture enables Kalos to realize the highest level of performance in the smallest footprint of any production non-volatile memory (NVM) ATE system available today, and Personal Kalos brings this architecture and performance to the engineer's lab bench or desktop.


  • Desktop configuration 
  • 48 I/O pin / 50 MHz test site or 96 I/0 pin (xp) 
  • 70 MHz clock available 
  • Tester on a Card Architecture 
  • Kalos Interactive Test Environment (KITE) software 

Available: Taiwan, China





 

 

SoC Test
RF and Linear Test
NVM Test
Memory Module Test


NVM Test


Taiwan Contact:
Laura_Kao@spirox.com.tw
Tel. +886-3-5738099 ext. 2019

China Contact:
Judy_Lee@spirox.com.tw
Tel. +86 21 6108-1858