Spirox - Seeking Smarter Solutions™

Memory Module Test
Tanisys M1K
The M1K, a cost-effective DDR device test solution, can test 800MHz+ DDR/DDR2/DDR3 devices and modules, including FB-DIMM.

Device and module test capability designed for high parallelism and efficiency
Flexible timing architecture for at speed testing
Comprehensive algorithmic pattern generation and extensive test capability
DNA architecture provides effortless engineering to production path
Fully capable integrated development environment and tools

Available: Taiwan, China, Sinagapore

Tanisys M600
The Tanisys Model 600 is the powerful platform for DRAM module test, offering DDR-II support for modules operating at up to 533MHz.

Supports 184, 200 and 240 pin JEDEC - DIMMs, 144 and 200 pin JEDEC - SO-DIMM
Optional shmoo plotting and bit mapping
Optional auto timing tool
Optional margin tool
Optional scripting tool
Optional MemTest PC diagnostics
Optional device level support
Speed up to 533MHz

Available: Taiwan, China, Sinagapore

Tanisys M500
The Tanisys Model 500 is the leading platform for flash card test today. Supported formats include CompactFlash, MMC, SD, Memory Stick, USB cards, and even proprietary card formats.

MMC, SD, Memory Stick, CompactFlash, USB
Designed for quick change over in production between memory types
Production configurable
Hand plug designed for greatest throughput
Easily integrated to automated handler

Available: Taiwan, China, Sinagapore

SoC Test
RF and Linear Test
NVM Test
Memory Module Test

Memory Module Test

Taiwan Contact:
karen_wu@spirox.com.tw
Tel. +886-3-5738099 ext. 3039

China Contact:
Jessica_Chew@spirox.com.tw
Tel. +86 21 6108-1858

Singapore Contact:
seowying@spirox.com.sg
Tel. +65-6542-5488