Yield Enhancement
LogicVision SiVision

LogicVision’s SiVision application is a comprehensive and automated semiconductor data analysis and visualization solution. It automates and integrates key components of the characterization and production monitoring processes.


  • Automated SmartPE reports: parameter summary report, warning report
  • Basic analysis capabilities: flexible reports, shmoo plots, box plots, historgrams, pareto charts, limits setting, what-if analysis
  • Convenience features: scheduled reports, report portfolio, report history, parameter derating
  • Data navigation aids: pop-up data summaries, multi-threaded reports, context-sensitive drill downs
  • Production monitoring capabilities: wafer maps, stacked wafer maps, manufacturing genealogy, automated alerts

Available: Taiwan







 

 

Embedded Test
Mixed Signal BIST
Silicon Debug
Yield Enhancement


Yield Enhancement


Taiwan Contact:
Cynthia_Chen@spirox.com.tw
Tel. +886-3-5738099 ext. 2029