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 Dynamic Timing Analysis Credence Emiscope Dynamic time resolved emission microscopes enable picoseconds resolution and high bandwidth timing measurement. The EmiScope is a completely non-invasive IC diagnostic platform for design debug and failure analysis. It can measure logical switching activity and timing information with picoseconds accuracy from virtually any active transistor in both flip-chip and wirebond devices. EmiScopes are used around the world to solve the most challenging circuit problems on leading-edge technology. 
Emission Microscope Credence EFA for EMMI Credence EFA for EMMI products provide failure analysis and yield enhancement engineers unprecedented visibility to very faint emission signals and dynamic/static laser scanning at the node level. A high sensitivity optical diagnostic platform for front- or back-side (through the substrate) design debug and failure analysis provides extremely high signal to noise ratios and exceptional spatial resolution to detect abnormal emission conditions. With its highly sensitive detectors, high numerical aperture (NA) IR optics design, and advanced fault localization software capabilities, the Credence EFA for EMMI dramatically eases the difficult and time-consuming process of global fault localization.
Front & Back-Side Circuit Editing Credence OptiFIB OptiFIB is the first and only focused ion beam (FIB) instrument to combine photon and ion optics in a coaxial column, providing real-time imaging for navigation and unmatched milling accuracy for front- and backside circuit editing. The remarkable coaxial column and photon optics enable you to see through silicon, to accurately align the FIB and CAD images and simultaneously drill with unparalleled precision.
Laser scanning Credence GlobalScan Credence GlobalScan is a laser scanning microscope (LSM) that pinpoints complex design and process issues. It can be configured for both dynamic and static applications. In dynamic mode, GlobalScan can highlight which parts of a circuit are causing thermal, speed, voltage, or other performance marginalities. In static mode, GlobalScan can find the source of failures often missed by ATPG methodologies. Dual lasers built into the system enable wide failure coverage, from resistive vias to electromigration.
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Emission Microscope Front & Backside Circuit Editing Laser Scanning 
Laura_Kao@spirox.com.tw Tel. +886-3-5738099 ext. 2019
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