|
|||||||||||||
 CD Measurement System Hitachi ZA-H200 This system automatically measures line width and overlay accuracy of various patterns produced with not only metal but also transparent layer of ITO, Si and etc. during manufacture of LCD glass. This system is a comparative measurement system that is calibrated with standard scale. 
Wafer Thickness Measurement System Futo FT300 / FT3031 Capable of measuring 4" to 12" wafers, the FT300 model can hold 4", 5", 6", 8" and 12" wafers on the chuck table. It is made with conductive SUS mirror finish, damage free.
 |
 
Wafer Thickness Measurement System 
Sharon_Chen@spirox.com.tw Tel. +886-3-5738099 ext. 2912 China Contact: 新加坡:
|
||||||||||||
