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MT6135S

MT6135S

MT6135S

The MT6135S Memory Test System is a next-generation memory test system for evaluation analysis and mass production. MT6135S is developed to support various types of memory devices for 300mm wafer lines while significantly improving cost performance.

 

Basic Specifications

Maximum operating frequency: 444 MHz/ 888 Mbps

Overall timing accuracy: ±300ps, DRV/CMP ±150ps  

Maximum number of parallel DUTs: 1536(* 2bit type)/ TH

Test Head: 1 unit

Device to measured: DRAM, SRAM, PSRAM, Flash, MCP, hybrid memory ASIC

 


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