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KRONOS - Wafer level test handler for 6/9DOF sensors

Very high UPH capacity and the lowest cost of test (COT)

KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.

KRONOS has a unique wafer prober mechanics placed on a 2-axes turning unit.  Sturdy prober structure enables stepping in any orientation or during rotation without losing accuracy. With Magnetic Stimulus unit integrated into the probe card KRONOS can test 9DOF sensors.

KRONOS is a solution for wafer level testing of accelerometers, gyroscopes and magnetometers, on bare wafer or on blue tape after dicing.

Wafer sizes up to 8” are applicable.



芬蘭商AFORE專注提供晶圓級(Wafer level)MEMS IC測試方案,提供low invest cost,和高UPH方案。AFORE已經得到眾多國際知名MEMS廠商品質驗證通過,可以實現加速計,陀螺儀,TPMS,環境和氣體等不同的MEMS IC測試。為了提供Lab級研發和小批量測試,AFORE經過多年完成了實驗室機台的METIS 。