Probe Card

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Parametric(WAT) Probe Card

Parametric(WAT) Probe Card


Parameter measurement and analysis of engineering wafers in engineering or mass production.


Ultra-low leakage, low electric heat.
Fast delivery and economical.

Shenzhen DGT Technology Co., Ltd.  is located in Shenzhen, the first city of China's reform and opening up, where there are many technology companies. Dougter Technology Co., Ltd. (DGT) focuses on the design, manufacture and maintenance of probe cards for testing such as semiconductor wafer (IC) testing, LCD screen testing, DRAM testing and other testing probe cards. Sales of needles and LED spot styli.