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KRONOS - Wafer level test handler for 6/9DOF sensors

Very high UPH capacity and the lowest cost of test (COT)

KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.

KRONOS has a unique wafer prober mechanics placed on a 2-axes turning unit.  Sturdy prober structure enables stepping in any orientation or during rotation without losing accuracy. With Magnetic Stimulus unit integrated into the probe card KRONOS can test 9DOF sensors.

KRONOS is a solution for wafer level testing of accelerometers, gyroscopes and magnetometers, on bare wafer or on blue tape after dicing.

Wafer sizes up to 8” are applicable.


AFORE is a pioneer in MEMS test equipment industry and offers a range of advanced test solutions for MEMS devices, including the world's only commercial Wafer-Level Chip Scale Packaging (WLCSP) MEMS test solution for motion sensors. Afore's solutions are used in MEMS development ad manufacturing in the automotive, industrial, and consumer sectors in Europe, USA and Japan. Afore was founded in 1995 and serves its global customers from its headquarters in Lieto, Finland.

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