Probe Card

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DDI(Display Driver IC) Probe Card

DDI(Display Driver IC) Probe Card


Testing of Display Driver ICs for driving LCD/OLED products.


  • Stable contact to the Pad can be maintained by using alloy needles.
  • Reduce the damage to the Pad through low needle pressure and low sliding amount.
  • Reduce needle wear by enabling low-frequency needle clearing.
  • Reduce test costs by testing multiple DUTs at the same time.
  • The supports are very narrowly spaced.

Shenzhen DGT Technology Co., Ltd.  is located in Shenzhen, the first city of China's reform and opening up, where there are many technology companies. Dougter Technology Co., Ltd. (DGT) focuses on the design, manufacture and maintenance of probe cards for testing such as semiconductor wafer (IC) testing, LCD screen testing, DRAM testing and other testing probe cards. Sales of needles and LED spot styli.